When used to describe the dosimetry of ionizing radiation in the biological or biomedical setting, the LET (like linear stopping power) is usually expressed in units of keV/µm.
In space applications, electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing "single event effects". The effect of the radiation is described by the LET (which is here taken as synonymous with stopping power), typically expressed in units of MeV·cm²/mg of material, the units used for mass stopping power (The material in question is usually Si for MOS devices). The units of measurement arise from a combination of the energy lost by the particle to the material per unit path length (MeV/cm) divided by the density of the material (mg/cm³).
"Soft errors" of electronic devices due to cosmic rays on earth are, however, mostly due to neutrons which do not directly interact with the material and whose passage can therefore not be described by LET. Rather, one measures their effect in terms of neutrons per cm2 per hour, see Soft error.
Read more about this topic: Linear Energy Transfer
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